Detecting, analyzing and classifying process defects provides vital information fabs need. Trust a solution that delivers demonstrated classification results at many leading semiconductor manufacturers worldwide, reducing escapes and over-kill while improving yield and lowering costs. Trust a solution that will pay for itself repeatedly.
TrueADC Software uses a dynamic defect library method that differs from traditional ADC by providing classifications based on actual defect examples rather than ‘best fit’ approximations or ‘fuzzy logic’ descriptors. TrueADC software includes non-referential classification using deep learning algorithms for applicable defect types. TrueADC software includes recipe sharing and a pre-production qualification module. The software offers scalable, high-speed classification and a straightforward recipe creation process.
Tool-centric offline review and classification software
Memory has become the cornerstone of the electronic world and one of the most critical semiconductor devices manufactured today.
Whether on wafer or panel, fan-out packaging offers reduced package cost and/or form factor.