Photoluminescence (PL) mapping is a key yield predicting metric used in the photonics and power industries. This is a technology measuring epitaxial wafers in an HVM environment generating high density maps of wavelength, peak intensity, FWHM, and other relevant photonics material. This technology is also used by MOCVD OEMs, Epi OEMs and R&D labs studying overall wafer level, process level and tool level epitaxial variations. 

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