Continued and unrelenting advances in both probe card and semiconductor test technology have conspired to bring new challenges for both probe card and probe card analyzer suppliers. This paper will address some of the electrical testing challenges and potential solutions, including…
- Analyzer channel count – Flexible channel configuration for current and future channel counts
- Probe card interface flexibility / constraints – Open PCA architecture
- Probe card electrical test coverage – New flexible test recipe controls
- Debugging/repairing electrical state issues - Stop and continue features for debugging and repairing electrical state issues
- Overall throughput of electrical test – The potential throughput improvements via parallelism and test modularity
