Sep 6, 2024 Taipei, Taiwan

Addressing Key Challenges in Enabling AI and Specialty Applications Through Unique Metrology, Inspection and Lithography Technologies

Al Gamble

Presentation at SEMICON Taiwan Semiconductor Advanced Inspection and Metrology Forum
9:00am — 10:00am

The semiconductor ecosystem has experienced several waves of growth. These growth waves have been dominated by the onset of the personal computer, followed by the arrival of the internet, and then the smartphone. The next wave of growth is going to be largely dominated by the demand for AI enabled device technologies.  The demand for AI technologies cuts across multiple segments of the semiconductor industry from advanced node next generation CPU/GPUs supporting high bandwidth memory to chiplet technologies drawn from a variety of mature and specialty node device technologies & finally, advanced packaging at both the wafer and panel levels.  This presentation will introduce Onto Innovation and discuss the many challenges faced in supporting waves of end market growth enabled by advanced technologies such as AI or enabling specialty technologies such as Power in Automotive and Green Energy, it will highlight the many unique and powerful process control technologies Onto is bringing to the semiconductor market.