Discover® Yield Software
An advanced yield analysis toolkit that seamlessly integrates data from your entire enterprise, helping to prevent loss and better understand your process needs.
Discover® Defect Software
Discover Defect software provides actionable value to raw data through its intelligent, real-time analytics techniques. Inline monitoring, alarming and reporting is standard with all inspection tools, as well as offline fab-wide analysis with all licensed third-party tools.
Product Overview
Discover Defect software readily integrates into any wafer or panel production environment. It flexibly brings together all pertinent fab information, including defect, sort, metrology, wip, and electrical, into a single big data-capable solution. Its speed and up-time are world class.
Discover Defect software will pay for itself repeatedly by enabling its users to identify and solve problems, as well as to monitor and alarm on known areas of concern quickly and accurately. The product is designed to improve both throughput and yield while simultaneously reducing manufacturing costs.
Expand your yield analysis capabilities with the power of the Discover Yield software module. Discover Yield software’s patented data mining capabilities and advanced statistical analysis allow for highly sophisticated, interactive root cause analysis. Discover Yield software gives you the power to deep-dive into your data to uncover even the most difficult-to-identify systemic process issues.
Applications
- Memory
- Logic
- Foundry
- Compound-Semi
- LED
- Advanced Packaging
Discover Mapping Suite
Comprehensive mapping suite that covers all aspects of semiconductor processes
Discover High Volume Metrology (HVM) Bump Server
Targeted modules specific to customer challenges
Discover® Review Software
Your smart factory’s human classification interface.
Discover® Patterns Software
Revealing signals hidden in everyday noise.
Through the Glass: Why the Rapid Development of TGV Demands Rigorous Analysis
Achieving Zero Defect Manufacturing Part 2: Finding Defect Sources
The Importance of Secure Data Sharing
Optimizing Advanced IC Substrates (AICS) for PLP
Addressing Yield Challenges in Advanced IC Substrate (AICS) Packaging
Sky High: More Thoughts To Consider Before Transitioning To The Cloud
Up and Away!: Clear-eyed considerations for your cloud-adoption journey
Nip the Defect in the Bud: Using an external inspection system and FDC software increases ABF substrate yield
The Big Squeeze – Why OSATs Need to Work Smarter
Do you have a Discover Defect software question? Let’s talk!
As your partner for innovative solutions, we’re always here for you.
Discover how our cutting-edge semiconductor solutions are engineered to meet your most complex challenges: delivering performance, reliability and innovation where it matters most.
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Discover® Yield Software
Discover Yield software is a complete yield management enterprise platform that combines parametric, defect and yield optimization with data mining and workflow development across all data sources from memory and design to assembly and packaging.
Product Overview
Discover Yield software helps reduce the time it takes to find root causes of yield excursions and enables manufacturers to broaden their analysis scope for better yield management.
The software includes data acquisition and integration, a development environment through workflow and scripting, and specialized analysis algorithms to identify domain-specific issues, such as data mining, spatial anomalies, wafer processing sequence problems, commonality of effects, system and random yield loss, chamber matching, tool events, traceability and more. In addition, Discover Yield software provides distinct tools – principal components and multivariate analysis of variance (MANOVA) – that allow systematic, simultaneous examination of multiple variables. Discover Yield software’s database architecture for genealogy uniquely supports value chain predictive analytics.
Improving baseline yield with analytics
Applications
- End-to-end root cause finding for semiconductor manufacturing
- Integrate with Discover AI for process & yield prediction
- Genealogy capability ties context information from bare wafer to integrated package
- Enable rapid equipment studies and equipment matching
- Integrate with Reports service to automate repeat reports for traceability
Discover® Defect Software
Integrated defect management system that works seamlessly with Onto tools and your entire enterprise, bringing data together for greater visibility and cleaner operation.
Discover® FDC Software
Your tool’s stepping stone to maximize efficiency, minimize downtime and ensure quality results.
Yield Optimizer™ Software
Machine learning built with semiconductor manufacturing in mind.
The Importance of Secure Data Sharing
Addressing Yield Challenges in Advanced IC Substrate (AICS) Packaging
Using Machine Learning to Increase Yield and Lower Packaging Costs
Metrology Sampling Plans Are Key For Device Analytics And Traceability
Up and Away!: Clear-eyed considerations for your cloud-adoption journey
Nip the Defect in the Bud: Using an external inspection system and FDC software increases ABF substrate yield
Extreme Ancestry: Silicon Edition
Strategies For Meeting Stringent Standards For Automotive ICs
What Does It Take To Build A Successful Multi-Chip Module Factory?
Fab Fingerprint for Proactive Yield Management
The Big Squeeze – Why OSATs Need to Work Smarter
Do you have a Discover Yield software question? Let’s talk!
As your partner for innovative solutions, we’re always here for you.
Discover how our cutting-edge semiconductor solutions are engineered to meet your most complex challenges: delivering performance, reliability and innovation where it matters most.
Let’s Talk
"*" indicates required fields