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Discover® Yield Software

Discover Yield software is a complete yield management enterprise platform that combines parametric, defect and yield optimization with data mining and workflow development across all data sources from memory and design to assembly and packaging.

Product Overview

Discover Yield software helps reduce the time it takes to find root causes of yield excursions and enables manufacturers to broaden their analysis scope for better yield management.

The software includes data acquisition and integration, a development environment through workflow and scripting, and specialized analysis algorithms to identify domain-specific issues, such as data mining, spatial anomalies, wafer processing sequence problems, commonality of effects, system and random yield loss, chamber matching, tool events, traceability and more. In addition, Discover Yield software provides distinct tools – principal components and multivariate analysis of variance (MANOVA) – that allow systematic, simultaneous examination of multiple variables. Discover Yield software’s database architecture for genealogy uniquely supports value chain predictive analytics.

 

Discover® Yield Software

Improving baseline yield with analytics

Applications

  • End-to-end root cause finding for semiconductor manufacturing
  • Integrate with Discover AI for process & yield prediction
  • Genealogy capability ties context information from bare wafer to integrated package
  • Enable rapid equipment studies and equipment matching
  • Integrate with Reports service to automate repeat reports for traceability
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Do you have a Discover Yield software question? Let’s talk!

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Discover how our cutting-edge semiconductor solutions are engineered to meet your most complex challenges: delivering performance, reliability and innovation where it matters most.

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