Discover® Defect Software
Discover Defect software provides actionable value to raw data through its intelligent, real-time analytics techniques. Inline monitoring, alarming and reporting is standard with all inspection tools, as well as offline fab-wide analysis with all licensed third-party tools.
Product Overview
Discover Defect software readily integrates into any wafer or panel production environment. It flexibly brings together all pertinent fab information, including defect, sort, metrology, wip, and electrical, into a single big data-capable solution. Its speed and up-time are world class.
Discover Defect software will pay for itself repeatedly by enabling its users to identify and solve problems, as well as to monitor and alarm on known areas of concern quickly and accurately. The product is designed to improve both throughput and yield while simultaneously reducing manufacturing costs.
Expand your yield analysis capabilities with the power of the Discover Yield software module. Discover Yield software’s patented data mining capabilities and advanced statistical analysis allow for highly sophisticated, interactive root cause analysis. Discover Yield software gives you the power to deep-dive into your data to uncover even the most difficult-to-identify systemic process issues.
Applications
- Memory
- Logic
- Foundry
- Compound-Semi
- LED
- Advanced Packaging
Discover Mapping Suite
Comprehensive mapping suite that covers all aspects of semiconductor processes
Discover High Volume Metrology (HVM) Bump Server
Targeted modules specific to customer challenges

Do you have a Discover Defect software question? Let’s talk!
As your partner for innovative solutions, we’re always here for you.
Discover how our cutting-edge semiconductor solutions are engineered to meet your most complex challenges: delivering performance, reliability and innovation where it matters most.
Let’s Talk
"*" indicates required fields