
Process Control & Analytics Software
Empowering digital transformation in semiconductor manufacturing, Onto software connects data for competitive advantage and industry 4.0 success.
The Digital Transformation Waits for No One
In the race to digitize semiconductor manufacturing operations, Onto Innovation’s productivity software delivers the competitive advantage you need to capture market share. Our software connects information on a tool, within a factory or across an entire global supply chain to capitalize on the potential of your biggest asset: your data.
With feature-rich applications, artificial intelligence and scalable data solutions, our holistic approach weaves together all forms of material, equipment and process information to enable fully automated, semi-automated, or “on-the-spot” data analysis. In the pursuit of industry 4.0, seize your edge with the only complete solution for process control and analysis.



ControlWORKS® Software

Discover® AI Software

Discover® Defect Software

Discover® FDC Software

Discover® Patterns Software

Discover® Review Software

Discover® RMS Software

Discover® Run-to-Run Software

Discover® Yield Software

StepFAST® Software

TrueADC® Software

Yield Optimizer™ Software

Getting The Biggest ROI On Your Digital Twin

Picking up the Pace of Panel-level Advanced Packaging at Onto Innovation

Achieving Zero Defect Manufacturing Part 2: Finding Defect Sources

The Importance of Secure Data Sharing

Using Automatic Defect Classification to Reduce the Escape Rate of Defects

Using Deep Learning ADC for Defect Classification for Automatic Defect Inspection

Using Advanced Analytics To Meet ESG Goals

Using Machine Learning to Increase Yield and Lower Packaging Costs

Metrology Sampling Plans Are Key For Device Analytics And Traceability

Sky High: More Thoughts To Consider Before Transitioning To The Cloud

Up and Away!: Clear-eyed considerations for your cloud-adoption journey

The Human Hand: Curating Good Data and Creating an Effective Deep-Learning R2R Strategy for High-Volume Manufacturing

Nip the Defect in the Bud: Using an external inspection system and FDC software increases ABF substrate yield

Extreme Ancestry: Silicon Edition

Strategies For Meeting Stringent Standards For Automotive ICs

What Does It Take To Build A Successful Multi-Chip Module Factory?

Fab Fingerprint for Proactive Yield Management

How Do Machines Learn?

Demystifying ADC

The Big Squeeze – Why OSATs Need to Work Smarter

Artificial Intelligence and Machine Learning in Semiconductor Manufacturing: Inspection and Metrology

Do you have a process control & analytics software question? Let’s talk!
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Discover how our cutting-edge semiconductor solutions are engineered to meet your most complex challenges: delivering performance, reliability and innovation where it matters most.
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