Discover® Defect Software
Integrated defect management system that works seamlessly with Onto tools and your entire enterprise, bringing data together for greater visibility and cleaner operation.
Process Control & Analytics Software
Empowering digital transformation in semiconductor manufacturing, Onto software connects data for competitive advantage and industry 4.0 success.
The Digital Transformation Waits for No One
In the race to digitize semiconductor manufacturing operations, Onto Innovation’s productivity software delivers the competitive advantage you need to capture market share. Our software connects information on a tool, within a factory or across an entire global supply chain to capitalize on the potential of your biggest asset: your data.
With feature-rich applications, artificial intelligence and scalable data solutions, our holistic approach weaves together all forms of material, equipment and process information to enable fully automated, semi-automated, or “on-the-spot” data analysis. In the pursuit of industry 4.0, seize your edge with the only complete solution for process control and analysis.
Discover® FDC Software
Your tool’s stepping stone to maximize efficiency, minimize downtime and ensure quality results.
Discover® Patterns Software
Revealing signals hidden in everyday noise.
Discover® AI Software
A cutting-edge AI engine built for semiconductor manufacturing, providing actionable predictions and insights across nearly any process area.
Discover® Review Software
Your smart factory’s human classification interface.
Discover® RMS Software
The cornerstone to factory control through recipe management.
Discover® Run-to-Run Software
Automating process control with precision and efficiency
Discover® Yield Software
An advanced yield analysis toolkit that seamlessly integrates data from your entire enterprise, helping to prevent loss and better understand your process needs.
StepFAST® Software
An advanced feed-forward lithography software solution for fan-out panel level packaging that enhances yield and throughput by correcting die placement errors through external measurements, predictive analytics and adaptive shot control.
TrueADC® Software
Automated defect classification software with deep learning, real defect modeling and seamless integration with Onto AOI tools.
Yield Optimizer™ Software
Machine learning built with semiconductor manufacturing in mind.
AutoShell® Software
Integrate equipment and factory 4.0+ systems quickly and comprehensively
ControlWORKS® Software
The SEMI compliant foundation for process equipment operation and material movement.
Getting The Biggest ROI On Your Digital Twin
Picking up the Pace of Panel-level Advanced Packaging at Onto Innovation
Achieving Zero Defect Manufacturing Part 2: Finding Defect Sources
The Importance of Secure Data Sharing
Using Automatic Defect Classification to Reduce the Escape Rate of Defects
Using Deep Learning ADC for Defect Classification for Automatic Defect Inspection
Using Advanced Analytics To Meet ESG Goals
Using Machine Learning to Increase Yield and Lower Packaging Costs
Metrology Sampling Plans Are Key For Device Analytics And Traceability
Sky High: More Thoughts To Consider Before Transitioning To The Cloud
Up and Away!: Clear-eyed considerations for your cloud-adoption journey
The Human Hand: Curating Good Data and Creating an Effective Deep-Learning R2R Strategy for High-Volume Manufacturing
Nip the Defect in the Bud: Using an external inspection system and FDC software increases ABF substrate yield
Extreme Ancestry: Silicon Edition
Strategies For Meeting Stringent Standards For Automotive ICs
What Does It Take To Build A Successful Multi-Chip Module Factory?
Fab Fingerprint for Proactive Yield Management
How Do Machines Learn?
Demystifying ADC
The Big Squeeze – Why OSATs Need to Work Smarter
Artificial Intelligence and Machine Learning in Semiconductor Manufacturing: Inspection and Metrology
Do you have a process control & analytics software question? Let’s talk!
As your partner for innovative solutions, we’re always here for you.
Discover how our cutting-edge semiconductor solutions are engineered to meet your most complex challenges: delivering performance, reliability and innovation where it matters most.
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