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Inspection
Automated, high-speed inspection and actionable data analysis for both unpatterned and patterned wafers and panels.
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Advanced Optical Critical Dimension (OCD) and Film metrology products to help ensure accuracy and repeatability for semiconductor manufacturers worldwide.
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Advanced packaging steppers designed to tackle manufacturing challenges, maximizing throughput while ensuring high resolution and precise overlay
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Empowering digital transformation in semiconductor manufacturing, Onto software connects data for competitive advantage and industry 4.0 success.
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Dedicated to panel-level packaging (PLP) innovations enabling 2.5D, FOPLP, 3D chiplet architectures, and AI packages for both glass and organic substrates (CCL)
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Spotlight
dec 2025 blog
Smaller Geometries, Bigger Demands: The Role of OCD in GAA Logic and Vertical Gate DRAM Process Control

AI workloads are pushing the boundaries of compute, memory, and interconnect architectures, and to meet these goals, manufacturers are rapidly accelerating advanced logic and DRAM development.

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SEMICON Japan

Dec 17 — Dec 19, 2025

Onto Innovation is a proud exhibitor at SEMICON Japan!

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11/17/25
Onto Innovation Completes Acquisition of Unique Materials Composition and Electrical Analysis Product Lines from Semilab International
11/11/25
Onto Innovation to Participate in Upcoming Investor Events
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Spotlight
dec 2025 blog
Smaller Geometries, Bigger Demands: The Role of OCD in GAA Logic and Vertical Gate DRAM Process Control
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Upcoming Events
tokyo-japan
SEMICON Japan

SEMICON Southeast Asia (SEA)

May 5 — May 7, 2026
Kuala Lumpur, Malaysia

Kuala-Lumpur-day

Onto Innovation will exhibit at SEMICON Southeast Asia!

Event Details

Date May 5 — May 7, 2026
Time 8:00am — 5:00pm
Location Kuala Lumpur, Malaysia