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Automated, high-speed inspection and actionable data analysis for both unpatterned and patterned wafers and panels.
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Advanced Optical Critical Dimension (OCD) and Film metrology products to help ensure accuracy and repeatability for semiconductor manufacturers worldwide.
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Spotlight
dec 2025 blog
Smaller Geometries, Bigger Demands: The Role of OCD in GAA Logic and Vertical Gate DRAM Process Control

AI workloads are pushing the boundaries of compute, memory, and interconnect architectures, and to meet these goals, manufacturers are rapidly accelerating advanced logic and DRAM development.

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SEMICON Korea

Feb 11 — Feb 13, 2026

Onto Innovation is a proud exhibitor at SEMICON Korea

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Onto Innovation to Participate in 28th Annual Needham Growth Conference
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Onto Innovation Receives TSMC Honor for “Excellent Production Support”
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Spotlight
dec 2025 blog
Smaller Geometries, Bigger Demands: The Role of OCD in GAA Logic and Vertical Gate DRAM Process Control
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Upcoming Events
seoul-korea
SEMICON Korea

SEMICON China

Mar 25 — Mar 27, 2026
Shanghai, China

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See you at SEMICON China 2026!

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Event Details

Date Mar 25 — Mar 27, 2026
Time 9:00am — 5:00pm
Location Shanghai, China
Exhibit Booth 5257