Discover® Yield Software
Discover Yield software is a complete yield management enterprise platform that combines parametric, defect and yield optimization with data mining and workflow development across all data sources from memory and design to assembly and packaging.
Product Overview
Discover Yield software helps reduce the time it takes to find root causes of yield excursions and enables manufacturers to broaden their analysis scope for better yield management.
The software includes data acquisition and integration, a development environment through workflow and scripting, and specialized analysis algorithms to identify domain-specific issues, such as data mining, spatial anomalies, wafer processing sequence problems, commonality of effects, system and random yield loss, chamber matching, tool events, traceability and more. In addition, Discover Yield software provides distinct tools – principal components and multivariate analysis of variance (MANOVA) – that allow systematic, simultaneous examination of multiple variables. Discover Yield software’s database architecture for genealogy uniquely supports value chain predictive analytics.
Improving baseline yield with analytics
Applications
- End-to-end root cause finding for semiconductor manufacturing
- Integrate with Discover AI for process & yield prediction
- Genealogy capability ties context information from bare wafer to integrated package
- Enable rapid equipment studies and equipment matching
- Integrate with Reports service to automate repeat reports for traceability
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