At Onto’s European technical symposium, we are proud to host valued customers and industry partners for an in-depth exploration of the latest innovations in inspection and metrology for semiconductor manufacturing. As device complexity increases with the introduction of new materials or unit processes, process control has become even more essential to ensuring yield, reliability and performance. This event will showcase the latest additions to Onto’s equipment portfolio and how they support a broad spectrum of applications—from logic and memory applications to high-volume manufacturing of mature node CMOS devices used in automotive, industrial and IoT markets. We will also highlight solutions for specialty and advanced packaging, including 2.5D/3D integration, where inspection and metrology play a pivotal role in enabling heterogeneous integration. Through technical presentations and live and collaborative discussion, attendees will gain insight into how our technologies are helping customers meet today’s manufacturing challenges and prepare for tomorrow’s opportunities.
We look forward to engaging with you, sharing perspectives and strengthening partnerships that drive innovation across the European semiconductor ecosystem.
Free to Attend / Lunch Provided / Registration Required
Co-located with SEMICON Europa
