Next generation large array probe card analyzer with advanced testing capabilities, meeting the needs of full wafer test and complex probe card applications that address 5G, CIS, memory and more.
The Voyager system is a revolutionary probe card analyzer with advanced test and analysis capabilities. The Voyager system fulfills the emerging needs of probe card manufacturers and users alike (non-memory and memory). From fine pitch cantilever to high pin count probe cards, the Voyager system provides leading throughput and accuracy for probe card test and analysis.
The Voyager system improves equipment utilization with faster test times for common tests including leakage, planarity, alignment, contact resistance, probe force and wire checker. Its sophisticated power/logic state controls, give the greatest component test coverage available on a probe card analyzer. Parallel electrical measurements across nodes drastically reduces test times, and with the node measurement meter connected directly to the interface measurement line loss is eliminated, providing the most accurate results available. Optical planarity feature allows for XYZ measurements without repeatedly overtraveling the probe card reducing wear from testing and protecting delicate needles. In addition, the system provides support for the most complex probe card technology interfaces.