QS2200™/Stratus™ System

Non-destructive wafer analysis

Product Overview

The QS2200/Stratus system is a FTIR metrology tool specifically designed for non-destructive wafer analysis. It is used for the characterization and measurement of semiconductor materials as well as device manufacturing.


QS2200/Stratus System
QS2200/Stratus System

You Have
a Challenge? We Love
a Challenge.

Let's Talk