Product Overview
The QS2200/Stratus system is a FTIR metrology tool specifically designed for non-destructive wafer analysis. It is used for the characterization and measurement of semiconductor materials as well as device manufacturing.
Non-destructive wafer analysis
The QS2200/Stratus system is a FTIR metrology tool specifically designed for non-destructive wafer analysis. It is used for the characterization and measurement of semiconductor materials as well as device manufacturing.